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Tektronix P6330 High Performance Differential ProbeThe P6330 enables users to make time domain or frequency domain measurements on high bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications. The P6330 provides high-bandwidth, low circuit loading, and low noise differential probing solutions. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface mount devices. Standard Accessories for Tektronix P6330
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| HOME Global Test Equipment, Inc., is your complete source for all of your global test supply needs! We stock thousands of manuals, parts and accessories for electronic test equipment! |
Global Test Equipment offers:
Counters, Data Acquisition, Lightwave, Logic Analyzers, Meters, Microwave, Network Analyzers, Oscilloscopes, Power Supplies, RF, Signal Analyzers, Signal Generators, Spectrum Analyzers, Switches, Telecommunications, Test Accessories, VXI, Misc.
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