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HP/Agilent E4480A Quote
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HP/Agilent E4480A 156MTS SONET Maintenance
Test Set
The field-portable E4480A 156MTS combines SONET,
ATM and T-carrier test for installation, qualification, and maintenance
test from DS0 to OC-12. The instrument provides a wide array of options
to support evolving network measurement needs.
Auto-Setup and Trouble-Scan capabilities
quickly synchronize with complex network configurations to report errors
on a high-contrast display. A full suite of BER test patterns with alarm,
error and pointer monitoring and generation capability is included for
T-carrier,
clear-channel and ATM payloads.
HP/Agilent E4480A Features
Comprehensive SONET, ATM and T-carrier test from DS0 to OC-12
Auto-Setup function automatically configures the instrument to match
the incoming signal
Trouble-Scan function identifies any alarms and errors at the push of
a button
Extensive array of front-panel LEDs report signal status at-a-glance
right across the hierarchy
Separate transmit and receive rates for cross-mux testing
Displays and controls a complete set of SONET overhead, including the
64byte path trace
STS-12c and STS-3c clear channel BER tests verify performance across
the full bandwidth
Cross-cell BER test at up to 100% of bandwidth for stress testing ATM
payloads
Cell loss, inter-arrival time and transfer delay measurements for ATM
Scans the incoming ATM signal and reports the bandwidths of active VPIs/VCIs
E1 in DS3 mapping including E1 timeslot testing
Drop and insert DS1/E1 from DS3 for thru mode testing
DS3 pulsemask measurements
In-depth DS1 test capability including in-band and out-of-band loopcodes
Tributary jitter measurements at STS-1, DS3, DS1 and E1
OPTIONS***
| Option |
description |
| 001 |
Remove STS-1, Add DS4 |
| 002 |
Remove STS-1, Add DS1/DS0 |
| 003 |
DS3 Pulse Mask Testing |
| 0YJ |
Second DS3 Receiver |
| 1A3 |
Bellcore CLEI Code |
| 1CF |
Soft Carrying Case |
| 201 |
Base Jitter Measurement |
| 202 |
DS3 Pulse Mask testing |
| 203 |
STS-12 and STS-12c/ATM Testing |
| 204 |
STS-12c BNC Error Output |
| 205 |
STS-12 ECL SMA Tx/Rx Data Clock |
| 206 |
1550nm IR Rear Panel Laser Tx |
| 207 |
1310nm IR Rear Panel Laser Tx |
| 208 |
1310nm LR Rear Panel Laser Tx |
| 209 |
1550nm LR Rear Panel Laser Tx |
| 230 |
230Vac Operation |
| 300 |
Interchangeable Optical Connector |
| 301 |
FC/PC Adapters |
| 302 |
ST Adapters |
| 303 |
D4 Adapters |
| 304 |
SC Adapters |
| 310 |
OC3/OC1 Testing w/IR Optics |
| 311 |
OC-12/3/3c/1 Testing with 1550nm |
| AW6 |
AC/DC Power Supply |
| AXA |
19-inch Rack Mount Kit |
| AXB |
23-inch Rack Mount Kit |
| H15 |
STS-1 Jitter Filter |
| R01 |
Media Retention |
| R02 |
STS-3C and Extended Overhead |
| R03 |
Extended Overhead |
| UHR |
IEEE-488 and RS-232 Interface |
| UHS |
External Answer (Modem) |
| UHX |
Fixed D4 Optical Connectors |
| UK7 |
Hard Carrying Case |
| UQ7 |
DS1C Test |
| UQA |
VT1.5 Mapping and Test |
| UQC |
STS-1 Testing |
| UQG |
OC3/OC1 Testing with IR Optics |
| UQH |
OC3/OC1 Testing with LR Optics |
| UQJ |
OC3/OC1 Testing with LR Optics |
| UQK |
OC-12/3/3c/1 Test with 1310 nm |
| UQL |
OC-12/3/3c/1 Test with 1310 nm |
| UQM |
OC-12/3/3c/1 Test with 1550 nm |
| UQN |
Base Measurement with STS-1 Jitter Filter |
| UQP |
DS3 Jitter Measurement |
| UQQ |
DS1 Jitter Measurement |
| UQR |
E1 Jitter Measurement |
| UQZ |
Second DS3 Tx/Rx |
| UR0 |
Set of 3 Rear Panel DS3 Outputs |
| URQ |
E1/Timeslot Test with E1 Drop |
| URR |
DS3 with Drop/Insert |
| URS |
DS1/DS0 Test wth Drop/Insert |
| URX |
Set of 3 Rear Panel STS-1 O/P |
| URY |
STS3-C Testing |
| URZ |
Advanced ATM Test |
| US0 |
Fractional T-1 Testing |
| US2 |
STS-3 ECL BNC Tx/Rx data |
*** The above list of options represents commonly found options. Units available from Global Test Equipment may have a combination of these options. Contact Us for detailed information about the options available on the units in stock.
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